Secondary Electron Microscope

Variable Pressure Scanning Electron Microscope (VP-SEM)

Scanning Electron Microscopy (SEM) is a powerful imaging instrument capable of analyzing particles, textures, surface features, and structures, too small to be seen with an optical microscope.

The Hitachi Variable-Pressure Scanning Electron Microscope (VP-SEM) incorporates state-of-the-art technology to produce high quality SEM imaging. Equipped with a powerful Back-Scatter Electron (BSE), and Energy-Dispersive X-ray (EDX) detectors the VP-SEM at PRF is an ideal analytical tool for many research applications.

When non-conductive materials such as biological samples or pharmaceuticals are analyzed with SEM, the electron beam irradiation causes charge build-up, and thus poor image quality. The variable-pressure mode employs a gaseous environment around the sample to reduce the charge build-up and dramatically improves imaging quality. The VP-SEM is ideal for many biological, pharmaceutical, polymer, and food sample analysis where charge build-up can be severe and other methods such as gold-sputtering are not desirable, or in-effective.

Features and Benefits:

•  Very high resolution: Guaranteed a 4.0 nm resolution at 25 KV in high vacuum and 5.0 nm resolution in variable pressure mode

•  High Magnification: Magnification range between 15 - 300,000x

•  Back-Scattered Electron (BSE): It is equipped with a BSE detector allowing for enhanced z-contrast, topographic contrast and removal of charging artifacts from image

•  Energy-Dispersive X-Ray (EDX): One of the most useful features of SEM analysis is EDX. It allows for simultaneous non-destructive elemental analysis of samples

•  Quartz XOne: The system includes Quartz microanalysis software and PCI image acquisition systems.

Please contact us for more information on SEM imaging services available at PRF. For information on Fees please click here.

Particle Research Facility (PRF)

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