Surface Characterization

Veeco Dektak 8 Stylus Surface Profiler:

The Dektak 8 surface profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system uses a programmable diamond tip stylus to characterize surface roughness, waviness and step height, as well as 3D mapping of surfaces.

Features and Benefits:

•  Low-Inertia Sensors : The low-inertia sensors provide 7.5 angstrom, 1 sigma step height repeatability and vertical range of up to 1mm

•  Overhead Gantry: This enables scan lengths to 200mm for planarity and flatness measurements

•  N-Lite Low-Force Sensor: This allows for scratch-free measurement of soft materials with stylus forces down to as low as 0.03mg. It also enables characterization of sub-micron lines and space for MEMS research

•  Advanced 3D data analysis software: for surface characterization of MEMS, semiconductors and other thin/thick films

Rhopoint Triple Angle Novo-Gloss Glossmeter:

The Novo-Gloss 20/60/85º glossmeter is a simple to operate instrument for measuring the gloss of flat surfaces. Using all three geometries described in ISO 2813 and ASTM D523 the instrument gives the best possible measurement resolution for all surfaces from matt to high-gloss coatings.

Please contact us for more information on Surface Analysis Equipments. For information on standard Charges please click here.

Particle Research Facility (PRF)

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